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Winfried Otto Schumann (May 20, 1888 – September 22, 1974) was a German physicist and electrical engineer who predicted the Schumann resonances, a series of low-frequency resonances caused by lightning discharges in the atmosphere.
- German
- May 20, 1888, Tübingen, Germany
Este fenómeno se llama así en honor de Winfried Otto Schumann (1888-1974), que predijo matemáticamente su existencia en 1952, [1] a pesar de ser observada por primera vez por Nikola Tesla y formar la base de su esquema para transmisión de energía y comunicaciones inalámbricas. [2]
28 de mar. de 2007 · [2] In 1952, Winfried Otto Schumann, a professor at the Technische Hochschule München, Germany, published several papers postulating the resonances of extremely low frequency (ELF) waves in the Earth-air-ionosphere waveguide excited by lightning discharges.
- B. P. Besser
- 2007
The global electromagnetic resonance phenomenon is named after physicist Winfried Otto Schumann who predicted it mathematically in 1952. Schumann resonances are the principal background in the part of the electromagnetic spectrum [2] from 3 Hz through 60 Hz, [3] and appear as distinct peaks at extremely low frequencies around 7.83 Hz ...
globales fue desarrollado por Winfried Otto Schumann en 1952. Las primeras me - diciones de ellas fueron logradas por Martin Balser y Charles Wagner en 1960. Las observaciones indican que la frecuencia fundamental de la resonancia Schumann tiene una longitud de onda cercana al perímetro de la Tierra, y sus
Translation: Catarina Geoghan, 2007) In 1952 Winfried Otto Schumann, at that time Director of the Electrophysical Institute at the Technical University of Munich, published his first paper about electromagnetic waves in the waveguide which is formed by the earth's surface and the ionosphere.
The life and work of Winfried Otto Schumann and the historical development of the main ideas leading to the hypothesis of Earth-ionosphere cavity electromagneti Synopsis of the historical development of Schumann resonances | AGU Journals & Magazine | IEEE Xplore
